FOCUSED ION BEAM: A "TOOL" FOR MICRO/NANO FABRICATION & CHARACTERIZATION

  • Online
  • Seminario

Relatori

Giuseppe Firpo
Dipartimento di Fisica - Università di Genova

Dettagli

The webinar will show a "fairly new" technology for micro and nano fabrication and characterization. It will face the Focused Ion Beam (FIB) technology, a tool available on the market form the early 2000s. With a FIB it is possible to image and to modify materials at micro and nanoscale by milling and deposition. Despite its complex architecture, it is a relative user-friendly machine, above all when it is included in a Dual Beam system with Electron Microscope.

The webinar will cover the following topics:

  • Imaging and micromachining at nanometer-micrometer scale
  • Surface modification and analysis
  • Maskless micromachining and nano tomography
  • Material Science and biological applications

The webinar is recommended to Academic Researchers and Technicians on Nanotechnology, Material Science, Cultural Heritage, people from R&D Teams of Nanotech industry in different fields of application (bio, fluidic, pharma, IC, etc.)  and to scientific dissemination entities on the state-of-the-art of the nano technology.

For registration visit:

https://physicsworld.com/l/webinars/

Bio

Giuseppe Firpo is a Physicist. Currently is a Technologist and Head of Technical Department at Dipartimento di Fisica – Università degli Studi di Genova. He is an expert on vacuum science and technology on whose topic has published patents and several scientific papers on peer-review journals. Since 2005 is also a FIB user to fabricate nanostructure for biomedical sensing device (Lab on chips) and for material science applications. His last research is on the permeability of ultra-thin membranes for gas separation technology.